|
论文著作
|
| 1.Application of image spectrometer to in situ infrared broadband optical monitoring for thin film deposition，Opt. Express，2011，19, 12969， |
| 2.Evolution of optical constants of silicon dioxide on silicon from ultrathin films to thick films，J. Phys. D: Appl. Phys.，2010，43, 445302， |
| 3.Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation，Appl. Phys. Lett.，2014，104, 121907， |
| 4.Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix，Applied Physics A 114，2014，Issue 2，423-427 |
| 5.Thickness-dependence of optical constants for Ta2O5 ultrathin films，Appl. Phys. A，2012，DOI 10.1007/s00339-012-7007-2， |
| 6.Approach to Error Analysis and Reduction for Rotating-Polarizer-Analyzer Ellipsometer，Journal of the Physical Society of Japan 81，2012，124003， |
| 7.Lateral shift effect on the spatial interference of light wave propagating in the single-layered dielectric film，Opt. Express 18，，10524， |
| 8.Study of the new ellipsometric measurement method using integrated analyzer in parallel mode，Opt. Express，2009，17 ( 10 ) , 8641， |
| 9.Design of non-polarizing cut-off filters based on dielectric-metal-dielectric stacks，Optics Express，2013，Vol.21, No.16, DOI: 10.1364/OE.21.019163 ，19163-19172 |
| 10.《近代光学》，北京：电子工业出版社，2011，， |