论文著作
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1.Application of image spectrometer to in situ infrared broadband optical monitoring for thin film deposition,Opt. Express,2011,19, 12969, |
2.Evolution of optical constants of silicon dioxide on silicon from ultrathin films to thick films,J. Phys. D: Appl. Phys.,2010,43, 445302, |
3.Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation,Appl. Phys. Lett.,2014,104, 121907, |
4.Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix,Applied Physics A 114,2014,Issue 2,423-427 |
5.Thickness-dependence of optical constants for Ta2O5 ultrathin films,Appl. Phys. A,2012,DOI 10.1007/s00339-012-7007-2, |
6.Approach to Error Analysis and Reduction for Rotating-Polarizer-Analyzer Ellipsometer,Journal of the Physical Society of Japan 81,2012,124003, |
7.Lateral shift effect on the spatial interference of light wave propagating in the single-layered dielectric film,Opt. Express 18,,10524, |
8.Study of the new ellipsometric measurement method using integrated analyzer in parallel mode,Opt. Express,2009,17 ( 10 ) , 8641, |
9.Design of non-polarizing cut-off filters based on dielectric-metal-dielectric stacks,Optics Express,2013,Vol.21, No.16, DOI: 10.1364/OE.21.019163 ,19163-19172 |
10.《近代光学》,北京:电子工业出版社,2011,, |